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Image Tester SPEA 4020 Flying Probe

Tester SPEA 4020 Flying Probe

The system allows for fast prototype design. The test program generation is fast and allows for quick reporting of the test results to technicians for technical implementations. The 4020 S2 can be equipped with multiple, independent, asynchronous test cores, each one with dedicated instrumentation and resources. Each X-Y-Z axis is equipped with high force linear motors. This technology provides high speed of movement and positioning stability. The system’s Multi-Jig Bottom Platform provides a wide range of instruments that enhance productivity and test capabilities: fixed probes, board support, mini-fixture, cable connection and the exclusive Self-Adapting Board Support Grid. Along with the Multi-Core Architecture, the Multi-Jig can work simultaneously with the 4 top flying probes.

Possible applications:
  • Electronic Circuit Board Testing
  • Quality Control
  • Automated Test
  • Fault Detection
  • Assembly assessment

Access information

Corresponding infrastructureImperial College London
The Hamlyn Centre
LocationBessemer Building, Kensington, London SW7, UK
Unit of accessWorking day

Technical specifications

No technical specifications specified.